Product Description
OPTIKA B-383MET
Trinocular Metallurgical Microscope
Part of the advanced B-380 series, the OPTIKA B-383MET is a versatile metallurgical microscope designed for both transmitted and incident light applications. It is ideal for brightfield and incident polarized light observation of opaque specimens. It features a trinocular head for digital documentation and a powerful dual illumination system, combining a transmitted X-LED³ with an incident X-LED³ epi-illuminator with its own polarizer and analyzer.
Designed for Materials Science
This model is equipped with high-quality, strain-free IOS W-PLAN MET objectives, which are specifically designed for "No Cover Glass" (NCG) use, making them perfect for viewing metallographic samples. It includes a large 233x147mm rackless stage with a tempered glass plate, coaxial focusing, and a quintuple nosepiece, providing a robust and precise platform for all materials science and quality control inspections.
| Dual X-LED³ Illumination System |
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| This microscope features two exclusive X-LED³ lighting sources. The transmitted illuminator is ideal for transparent samples, while the powerful incident (epi) illuminator is designed for opaque specimens. Both are 3.6W LEDs providing light comparable to a 50W halogen lamp, with a pure-white 6300K color temperature for constant color fidelity. |
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| Mechanical Stage Rackless Stage for Safety and Durability The B-380 series is equipped with a modern rackless mechanical stage. This design prevents the rack from protruding from the stage, avoiding potential scratches or injuries during use. The movement is smoother, more reliable, and provides a safer working environment, especially in educational settings. |
IOS W-PLAN MET Objectives (No Cover Glass)
OPTIKA's IOS W-PLAN MET objectives are strain-free and designed for observing samples without a cover slip. They deliver exceptionally bright, clear images with excellent flatness, which is essential for detailed metallurgical and materials inspection.
 | Large Specimen View (20 mm Field Number) The F.O.V. (field of view) is based on a comfortable diameter of 20 mm. This means that a wide area of the sample can be inspected and allows a natural and easy view, particularly needed in a laboratory environment. |
Epi-Illumination with Polarization
The incident illuminator is equipped with its own set of polarizer and analyzer filters, as well as field and aperture diaphragms, allowing for brightfield, oblique, and simple polarized light observation of opaque samples to reduce glare and reveal surface details.
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| Trinocular metallurgical microscope with dual X-LED³ (transmitted and incident) illumination and IOS W-PLAN MET objectives. |
| Observation mode: Brightfield (Transmitted), Incident Brightfield, Incident Polarized Light. | |
| Head: Trinocular (fixed 50/50), 30° inclined, 360° rotating. Interpupillary distance: Adjustable between 48 and 75 mm. | |
| Eyepieces: WF10x/20 mm, high eye-point and secured by screw. | |
| Nosepiece: Quintuple revolving nosepiece, rotation on ball bearings. | |
| Objectives: Strain-Free IOS W-PLAN MET 5x/0.12, 10x/0.25, 20x/0.40, 50x/0.75 (No Cover Glass). All with anti-fungus treatment. | |
| Specimen stage: Double layer rackless mechanical stage, 233x147 mm, 78x54 mm X-Y range. With tempered glass plate. | |
| Focusing: Coaxial coarse (adjustable tension) and fine focusing mechanism with limit stop. | |
| Transmitted Condenser: Abbe N.A. 1.25, with objective-coded iris diaphragm, focusable and centerable. | |
| Transmitted Illumination (Fixed Koehler): X-LED³ with white 3.6 W LED (6,300 K) with brightness control. | |
| Incident Illumination (Epi): X-LED³ (3.6W) with field/aperture diaphragms, polarizer & analyzer filters. | |
| Power Supply: Multi-plug 100-240Vac/6Vdc external power supply. |
